FACTYR

Failure Analysis | Characterisation | Test | Yield | Reliability

Supporting Innovation and Building Resilience

In today’s fast-moving semiconductor industry, failure analysis, reliability, characterisation, and test are essential to developing high-performing, reliable, and scalable technologies. From early design through to high-volume manufacturing, they ensure devices function as intended, issues are understood and resolved, and products meet the demands of sectors such as AI, automotive, communications, and defence.

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Why These Areas Matter

Failure Analysis (FA)

Failure analysis focuses on understanding why devices fail and how to address those issues effectively. By identifying root causes early, it helps reduce costly recalls and manufacturing losses, speeds up development cycles, and improves overall product reliability.

Characterisation

Characterisation examines how devices behave under different operating conditions, providing the data needed to refine designs and processes. It supports accurate modelling, enables process development and scaling, and ensures performance is properly validated.

Test

Testing verifies that devices meet required specifications before deployment. It plays a key role in identifying defects early in production, maintaining quality at scale, and reducing the risk and cost of failures later in the product lifecycle.

Yield

Yield focuses on maximising the proportion of functional devices produced from a manufacturing process. It is a key driver of cost, efficiency, and scalability, directly impacting profitability and time-to-market. By identifying sources of variation and loss, yield improvement enables faster process optimisation, supports stable high-volume production, and ensures that development efforts translate effectively into manufacturable, high-quality products.

Reliability

Reliability ensures that semiconductor devices perform consistently over time and under real-world stress conditions. It is particularly important for safety-critical applications and supports qualification across sectors such as automotive, aerospace, and healthcare, while also building confidence with customers and partners.

Our Mission

To build a more connected, capable, and resilient UK semiconductor test and analysis network. By working together, we aim to improve access to critical expertise, reduce reliance on overseas services, and help drive faster innovation

    The Challenge

    The UK has strong expertise in these areas, but access to capabilities is often fragmented. Many organisations rely on overseas providers, which can lead to:

    • Higher costs and longer turnaround times
    • Limited awareness of UK-based services

    Slower innovation and development cycles

    Our Focus

    Our work centres on three key areas:

    Improving access to capabilities

    We make it easier for UK companies to find and use the right tools, facilities, and expertise.

    Providing access to technical expertise

    We connect organisations with the specialists who can advise on effective approaches, workflows, and solutions, ensuring they get support from those best placed to provide it.

    Building skills and knowledge

    We support training, workshops, events, and collaborative activities that bring the community together.

    Mapping and strengthening the ecosystem

    We will map capabilities, identify gaps and opportunities, inform standards bodies and government.

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    Impact

    Through this work, we aim to:

    • Strengthen the UK semiconductor supply chain
    • Improve access to critical technical capabilities
    • Increase global competitiveness
    • Support sustainable, long-term industry growth

    Steering Board

    Andrew Elliot
    Business Development and Applications Lead
    Carl Zeiss Ltd
    Suzanne Costello
    Founder | CEO
    Forensic Eyes Limited
    Paul Jarvie
    Business Development Manager
    CSA Catapult
    Kevin Robinson
    Vice President of Operations
    yieldHUB
    Steve Reynolds
    Strategic Business Development Manager
    National Physical Laboratory (NPL)
    Mike Petty
    Director
    Loughborough Surface Analysis